Sonatest XEO
The Sonatest XEO is a premium, field-ready instrument designed for Non-Destructive Testing (NDT) professionals. It bridges the gap between high-end automated systems and portable functionality, packing advanced imaging capabilities into a rugged, compact design that can be customized to your application’s precise needs.
Key Features & Testing Methods:
Phased Array (PA-UT): Features true geometry rendering with sectorial and linear scanning for thorough data review. Includes live 3D ray tracing to validate scan configurations and guarantee maximum coverage.
TFM / TFMi™: Delivers high-speed, live imaging using up to 16 propagation modes across flat or curved parts. Provides sharp defect profiling with high-resolution imagery up to 4 megapixels per image.
Multi-Technique Synchronicity: Run Phased Array, TFM, and TOFD simultaneously in a single configuration. This lets you capture comprehensive inspection data in only one scan.
Modular Hardware & Software: Available in standard 64:128 or customizable 32:128 pulser/receiver setups, allowing you to pay only for the software features (Matrix, DMA, TFM) and hardware connector mini-docks you need.
